Memory Test Socket

可应用在 DRAM, LPDDR, Flash Memory 等的Memory semiconductor测试。
这还应用于 BGA, MLF, QFN, QFP, CSP等的Semiconductor package测试。

根据客户的要求, INNO GLOBAL可以设计被使用在Memory Semiconductor Test的Socket。

Mechanical  Specifications

pakage BGA, MLF ,QFN, QFP, CSP etc
Available pitch 0.25mm pitch ~
Characteristics For non-memory semiconductor test sockets – it can be designed according to customer requirements design